Early Registration Deadline: February 1, 2022
The 2022 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) will be held at the Monterey Marriott in Monterey, CA, March 14-17, 2022.
Conference registration will open in December 2021 and will likely include:
- Conference materials
- Welcome Reception
- Mid-Morning and Afternoon Breaks
- Poster Refreshments
- Banquet Dinner